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Applications
- Local Influence on Optical Properties and Thickness of ITO-Films by Means of Plasma Flow
- Microstructured lipid bilayers
- Graphene and Graphene Oxide
- Technology ellipsometry with the example graphene
- Dispersion Functions Manual
- Functional Coatings on Cantilevers
- Laser Diodes
- EP³ SPR
- Characterization of an anisotropic film
- Effective medium approach for nanoparticles in colloidal and photonic crystals
- Mapping of a thick transparent layer
- Microcontact Printed Monolayers inspected with Imaging Ellipsometry and Scanning Probe Microscopy
- Thickness measurement of SiO2 layer on Si-wafer.
- Micropatterned Polymer Films
- Characterization of glass micro array
- Kinetic Binding Studies using OptiSlides
- Characterisation of bulk-heterojunction layers for solar cell application
- Real-time monitoring of polyelectrolyte-multilayer growth onto tantalum pentoxide (Ta2O5) by internal reflection ellipsometry
- Publications
- References
- FAQ's
productflyer_ep__spr~1.pdf© 2012 · Accurion GmbH · Phone Headquarter Accurion Germany +49-(0)551-99960-0 · Accurion USA +1-(408) 245 8100 · Accurion Asia +91 98 450 04273
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- FAQ's
- Local Influence on Optical Properties and Thickness of ITO-Films by Means of Plasma Flow
- |
- Microstructured lipid bilayers
- |
- Graphene and Graphene Oxide
- |
- Technology ellipsometry with the example graphene
- |
- Dispersion Functions Manual
- |
- Functional Coatings on Cantilevers
- |
- Laser Diodes
- |
- EP³ SPR
- |
- Characterization of an anisotropic film
- |
- Effective medium approach for nanoparticles in colloidal and photonic crystals
- |
- Mapping of a thick transparent layer
- |
- Microcontact Printed Monolayers inspected with Imaging Ellipsometry and Scanning Probe Microscopy
- |
- Thickness measurement of SiO2 layer on Si-wafer.
- |
- Micropatterned Polymer Films
- |
- Characterization of glass micro array
- |
- Kinetic Binding Studies using OptiSlides
- |
- Characterisation of bulk-heterojunction layers for solar cell application
- |
- Real-time monitoring of polyelectrolyte-multilayer growth onto tantalum pentoxide (Ta2O5) by internal reflection ellipsometry