Brewster Angle Microscopy is a powerful label-free imaging technique for the investigation of ultra-thin organic films at surfaces, in particular monolayers at the air-water interface and Langmuir-Blodgett films on solid substrates.

Accurion offers two lines of Brewster Angle Microscopes:

Convince yourself just by watching demo videos taken with the new nanofilm_ultrabam:
(To start a video, please click on the images below.)

The new nanofilm_ultrabam provides overall-focused images in real-time! Till now Brewster Angle Microscopes look under an angle to the surface and provide just one line focused. To receive an overall focused image, a focus scanner was used to get a sharp image. The new generation of Brewster Angle Microscopy overcomes this problem: Due to an advanced optical setup the provided picture of the new generation of Brester Angle Microscopes is in focus through the entire field of view without use of an image scanner – even in real time. This is extremely advantageous for all floating monolayers. The resolution will be down to 2 microns. The instrument is designed for the air/water interface, but will also work on glass slides, at a range of 52°-57°.

As a restriction, this UltraBAM is designed as a pure BAM, so it will not allow upgrading to Imaging Ellipsometry.

The nanofilm_ultrabam will be presented at the LB13 in Quebec, Canada from the 18th till the 21st of July.

The flexible nanofilm_ep3bam is based on the proven nanofilm_ep3 imaging ellipsometry platform. It offers a wide angle range and is upgradable to Imaging Ellipsometry.

The nanofilm_ep3bam is an ideal thin films imaging system. It is a completely "hands-off" computer-controlled system, using proprietary motor control circuitry.The nanofilm_ep3bam displays real-time image of your sample directly on the monitor and features important image processing functions. An "objective scanner" provides extended depth-of-field for overall-focused images.

The combination of a high power green laser and excellent objectives allows lateral resolutions of 1 micron, the current limit of CCD optical detectors.

The powerful software (under windowsXP) makes operation easy and convenient. As a complete solution, the system comes including the computer, electronics, and all necessary software needed to begin measurements on your existing trough, or with one of our integrated NIMA troughs.
The nanofilm_ultrabam may be regarded as a specific form of Imaging Ellipsometry applicable to dielectric substrates like water, glass or oxides.