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Application Overview Halcyonics Products: Electron Microscopes

In this section, you will find pre-selected technologies and products matched to the most typical active vibration isolation solution we provide, based on our experience with a wide range of vibration sensitive equipment.

Please be aware that this list will not show a complete overview of technologies and products within this technologies. We want to provide an overview for technologies and products where we have made experiences over the last 15 years.
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If your application is missing or differs from shown applications or if you have different experiences, we would highly appreciate your comment.
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Electron Microscopes

An electron microscope is a type of microscope that uses a particle beam of electrons to illuminate the specimen and produce a magnified image. Electron microscopes (EM) have a greater resolving power than a light-powered optical microscope, because electrons have wavelengths about 100,000 times shorter than visible light (photons), and can achieve better than 50 pm resolution.

The electron microscope uses electrostatic and electromagnetic "lenses" to control the electron beam and focus it to form an image. These lenses are analogous to, but different from the glass lenses of an optical microscope that form a magnified image by focusing light on or through the specimen.

Established types of electron microscopes are:

  • Transmission electron microscope (TEM)
  • Scanning electron microscope (SEM)
  • Reflection electron microscope (REM)
  • Scanning transmission electron microscope (STEM)
  • Low-voltage electron microscope (LVEM)

There are also several spcial set ups in the market, such as: HeIM Helium ion microscope (SHIM), Focused Ion Beam (FIB), Field Emission Gun (FEG), Field Emission (FE)

Supplier
Technology
Product
Suggestion Halcyonics System
Carl Zeiss NTS GmbH
FE SEM
Carl Zeiss NTS GmbH
FE SEM
Hitachi
FE SEM
Tescan
FEG SEM
Tescan
FEG SEM
Carl Zeiss NTS GmbH
FIB SEM
FEI Company
FIB SEM
FEI Company
FIB SEM
Tescan
FIB SEM
Tescan
FIB SEM
Carl Zeiss NTS GmbH
HIM
Carl Zeiss NTS GmbH
SEM
Carl Zeiss NTS GmbH
SEM
FEI Company
SEM
FEI Company
SEM
FEI Company
SEM
FEI Company
SEM
FEI Company
SEM
Hitachi
SEM
Hitachi
SEM
Hitachi
SEM
Nikon Instruments
SEM
Tescan
SEM
Tescan
SEM
Tescan
SEM
Tescan
SEM
Carl Zeiss NTS GmbH
TEM
Carl Zeiss NTS GmbH
TEM
FEI Company
TEM
FEI Company
TEM
FEI Company
TEM
Hitachi
VP SEM